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RF Lab

The antenna laboratory provides capabilities of far-field and near field antenna pattern and scattering tests. Automatic measurements in a number of cuts and polarization can are performed in the frequency range of 1 GHz and up. Near-field tests utilize a precise scanning system over planar, cylindrical, and spherical surfaces with calibrated field probes. Scattering and RCS tests can be done with a transmit/receive dual-polarized antenna system. Data acquisition at both polarization over wide frequency ranges provides full radar polarimetric imaging tests based on the Inverse Synthetic Aperture Radar (ISAR) principle, which ties into ongoing work on fast radar imaging in the near and far-fields regimes. An Agilent Performance Network Analyzer (PNA) operates in the lab either as a stand-alone unit or as a part of the antenna range. Direct time-domain measurements are also performed using UWB signals with frequencies up to 50 GHz.

Main devices

8m x 5m x4m anechoic chamber (1GHz > -30 dB) with X,Y,Z and EL scanner

N5232B PNA-L Microwave Network Analyzer, 300kHz - 20 GHz

  • Perform basic analysis of passive components and simple active devices

  • Measure S-parameters with good accuracy up to 20 GHz in cost-sensitive applications

  • Get the world’s best price-to-performance ratio for microwave manufacturing

  • Configure an economical solution for signal-integrity measurements and materials characterization

  • Accelerate insight into component behavior using a multi-touch display and intuitive user interface

  • Maximum Frequency 20 GHz

  • Dynamic Range  133 dB

  • Output Power  13 dBm

  • Trace Noise 0.004 dBrms

  • Number of Built-In 4 ports

  • Harmonics -18 dBc

  • Noise Floor -120 dBm

  • Best Speed at 201 Point, 1 Sweep 6 ms

E8362B PNA Network Analyzer, 10 MHz to 20 GHz

  • 123 dB dynamic range and <0.006 dB trace noise

  • <26 usec/point measurement speed, 32 channels, 16,001 points

  • TRL/LRM calibration, on-wafer, in-fixture, waveguide, and antenna measurements

  • Mixer conversion loss, return loss, isolation, and absolute group delay

  • Amplifier gain compression, harmonic, IMD, and pulsed-RF .

N9923A FieldFox Handheld RF Vector Network Analyzer 6 GHz

  • Carry the world’s most accurate handheld RF T/R VNA analyzer

  • Save time by simultaneously measuring all four S-parameters (S11, S21, S12, S22) with a single connection

  • Expand capabilities with optional 2-port VNA, time-domain, vector voltmeter, cable and antenna analyzer and more

  • Perform accurate testing with QuickCal, full 2-port unknown thru Cal, TRL

  • Easily measure average and pulse power with a USB power sensor

  • Lightest handheld VNA at only 6.2 lb. (2.8 kg)

  • Maximum Frequency 6 GHz

  • Dynamic Range  100 dB

  • Output Power  5 dBm

  • CAT/VNA Start Frequency 2 MHz

  • Number of Built-In Ports 2 ports

  • Instrument Type Vector Network Analyzer

  • Cable and Antenna Analyzer Yes - Standard

  • Additional CAT/VNA Based Features: QuickCal (Subset), Vector Voltmeter, Mixed-Mode S-Parameters

  • Additional SA Based Features Built-In Power Meter

  • Handheld/Modular - Yes

  • System Features GPS Receiver - External Only

DSOX3104T Oscilloscope: 1 GHz, 4 Analog Channels

  • 1 GHz

  • 4 analog channels

  • Easily view and analyze your signals with on the large 8.5-inch capacitive touch screen

  • Isolate signals in seconds with exclusive Zone touch triggering

  • Signal detail with the 1,000,000 wfms/s update rate

  • Capture more data with up to 4 Mpts memory

N5173B EXG X-Series Microwave Analog Signal Generator, 9 kHz to 20 GHz

  • Output Power @1 GHz +23

  • Frequency Switching ≤ 600 µs

  • Frequency Modulation-Maximum Deviation @1 GHz 10 MHz

  • Frequency Modulation-Rate @100 kHz Deviation DC to 7 MHz

  • Phase Modulation-Maximum Deviation in Normal Mode 1.25 to 160 rad

  • Amplitude Modulation-Rate 0 to 100 kHz

81160A Pulse Function Arbitrary Noise Generator

  • Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution

  • Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards;

  • Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and

  • Arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits.

  • Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern

X11644A Mechanical Calibration Kit, 8.2 to 12.4 GHz, Waveguide, WR-90

  • The Keysight X11644A calibration kit contains the precision mechanical standards required to calibrate the systematic errors of Keysight network analyzers. This calibration kit has a precision airline for performing the Thru-Reflect-Line (TRL) calibration, the most accurate error-correction technique for coaxial measurements. This kit also contains a commercial calibration certificate, flush short circuit, a precision shim, and fixed termination(s).

  • Software for extraction complex value of permittivity and permeability

U2000A 10 MHz - 18 GHz USB Power Sensor

  • Frequency range of 10 MHz to 18 GHz

  • Wide dynamic range of -60 to +20 dBm

  • Internal zeroing capability to eliminate external calibration

  • High measurement speed of up to 250readings/second

  • Support internal and external trigger measurements

  • Display power measurements on a PC or other Keysight’s instruments

  • Internal triggering and trace display capability

  • (+) MAX AVG PWR 30 W

  • (+) 500W PEAK FOR 1 mks

85521A 4-in-1 OSLT Mechanical Calibration Kit, DC to 26.5 GHz
N4691B Electronic Calibration Module (ECal), 300 kHz to 26.5 GHz

  • DC to 26.5 GHz

  • Open phase error: 0 to 5 GHz ≤ 1.5°, 5 to 15 GHz ≤ 3.0°, 15 to 26.5 GHz ≤ 4.5°

  • Short phase error: 0 to 5 GHz ≤ 1.0°, 5 to 15 GHz ≤ 2.5°, 15 to 26.5 GHz ≤ 4.0°

  • Load return loss: 0 to 5 GHz ≥ 42 dB, 5 to 15 GHz, ≥ 36 dB, 15 to 26.5 GHz, ≥ 32 dB

MFLI Lock-in Amplifier

  • DC - 500 kHz / 5 MHz, 60 MSa/s, 16 bit

  • Current and differential voltage inputs

  • LabOne toolset: Scope, Sweeper, Spectrum Analyzer, etc.

  • Plug & Play with embedded LabOne® Web Server

  • USB 2.0 and 1 GbE high-speed connections

  • AC line and DC supply (battery) operation

Optical Lab

Optical trapping and manipulation of particles in solutions has been first reported in 1970 by A. Ashkin. Traditional studies involving optical trapping are focused on manipulation of micrometer-sized particles, such as polystyrene beads. The ability to apply piconewton-level forces with simultaneous displacement measurements with nanometer precision of the micron-sized particles has paved the route for the optical tweezers for single-molecule studies, studies of the physics of colloids and mesoscopic systems, mechanical properties of the polymers and more. However, optical trapping becomes challenging, once the size of a manipulated object lies within intermediate size range e.g. nanoscale. The types of the structures, which fall within this range, are quite broad: quantum dots, nanowires, nanotubes, graphene flakes and metallic nanoparticles. However, only few studies explored nano-scale trapping as a tool for cross-disciplinary studies and applications
. Trapping of nanoparticles faces several major challenges, which could be briefly summarized in 3 categories – detection/imaging, trapping, and resolution. Traditional bright-field transmission microscopy cannot be employed for visualization and detection of deep subwavelength particles (below 100 nm) due to diffraction limit constrains. While several advanced optical techniques are capable to deliver imaging beyond the diffraction limit, dark field microscopy is the most preferable and already tested tool for detection of scattering from particles down to 5nm in size. Incorporation of dark-field imaging with optical tweezers will enable direct detection of colloidal nanoparticles (e.g. silver, gold and high-index dielectrics) and verification of trapping events.

Key equipment

Cobolt Rumba

CW high-power single-frequency DPSS laser

  • Central wavelength – 1064.2±0.6 nm, spectral linewidth <1MHz

  • Power – 3000mW

  • Noise, 20Hz-20MHz (rms): <0.1%

  • Long-term stability: <2%

  • Beam – TEM00, M^2<1.1, divergence <1.6 mrad

  • Polarization – linear, vertical, >100:1

YSL Photonics SC-PRO

Supercontinuum laser source

  • Power: up to 6W (<900mW visible power)

  • Power stability: <1%

  • Power density: ~2mW/nm (@4MHz)

  • Repetition rate: 100kHz-25MHz, 100kHz step

  • Wavelength – 400-2400nm

  • Pulse energy <1μJ

  • Fundamental pulse width: ~100ps

  • Beam diameter: ~2mm@633nm

  • Beam quality: M^2<1.1, <1mrad

  • VLF tunable wavelength filter (option) – 400-840nm tuning range

Menlo systems YLMO 1030

Fiber femtosecond laser

  • Output power (W): up to 2W

  • Repetition rate: 100 MHz

  • Wavelength – 1030 nm

  • Fundamental pulse width: ~105 fs

  • Polarization: Linear

Litron Nano Series

Q-switched pulsed Nd:YAG laser

  • Output energy (mJ): up to 130@1064 nm, 65@532 nm, 25@355 nm, 16@266 nm

  • Repetition rate: up to 10 Hz

  • Wavelength – 1060, 532, 355, 266 nm

  • Fundamental pulse width: ~4-7 ns


Picosecond Diode Laser

  • Operating wavelength (nm) - 375 nm

  • Repetition rate: from single shot to 80 MHz

  • Pulse width - 20 ps

  • Power (mW) - up to 50

  • Operating modes: CW, pulsed

FBG laser diode

BL976-SAG300 fiber pigtailed laser diode

  • Laser driver – CLD-1015

  • Wavelength – 976 nm, Fiber Bragg grating stabilized

  • Bandwidth: <1nm

  • Power – <300mW


Andor Shamrock 193i (Kymera)

Motorized Czerny-Turner spectrograph

  • Focal distance – 193mm, F/3.6 aperture

  • Wavelength accuracy – 0.15nm, wavelength repeatability – 75pm

  • 150 lines/mm (blaze 800nm) and 600 lines/mm (blaze 500 nm) gratings

  • CAMERA - iDus420DV401A-BVF – cooled silicon CCD (400-1100nm)

Avantes AvaSpec ULS2048L

Fiber-coupled Czerny-Turner spectrometer, UV-enhanced, low straylight

  • Focal distance – 75mm

  • Wavelength range – 200-1100nm (300 lines/mm grating, blaze 300nm)

Time-Correlated Single Photon Counting

Picoquant TimeHarp 260 Pico Single

  • 25ps temporal resolution

  • Long range option (<2.5ns dead time)

  • Up to 40x106 counts/sec

  • number of time bins – 32768, 32 bit count depth

  • Microphoton Devices MPD-050-CTB – single-photon counting APD, <250 dark counts, 50 um active area, <50ps jitte

Holoeye Pluto NIR-015 LCOS spatial light modulator

(for holographic optical tweezers)

  • Reflective LCOS

  • 1920x1080 pixels, 8 um pixel pitch

  • 93% fill factor, 15.36x8.34mm active area

  • 60Hz input frame rate

  • 2Pi@1064nm phase shift

Confocal microscopy 

Leica TCS SP8 Confocal Miscroscope

Computational resources

  • 2 512G RAM, 2 x 12 cores @3.3 GHz computational servers

  • 2 64G RAM Work Stations, 2 x 6 cores @3.3 GHz

  • System for remote calculation

  • CST MICROWAVE STUDIO (current version)

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